Grazing Incidence X-ray Reflectance Measurement Of Surface And Interface Roughness On The Sub-nanometre Scale

Wormington, M; Sakurai, K; Bowen, DK; Tanner, BK

doi:10.1557/proc-332-525

Grazing Incidence X-ray Reflectance Measurement Of Surface And Interface Roughness On The Sub-nanometre Scale

Wormington, M; Sakurai, K; Bowen, DK; Tanner, BK

Authors

M Wormington

K Sakurai

DK Bowen

Brian Tanner b.k.tanner@durham.ac.uk
Conducting Exam Musician

Contributors

M. Sarikaya
Editor

H.K. Wickramasinghe
Editor

M. Isaacson
Editor

Citation

Wormington, M., Sakurai, K., Bowen, D., & Tanner, B. (1994, December). Grazing Incidence X-ray Reflectance Measurement Of Surface And Interface Roughness On The Sub-nanometre Scale. Presented at Symposium on Determining Nanoscale Physical Properties of Materials by Microscopy and Spectroscopy, Boston

Presentation Conference Type	Conference Paper (published)
Conference Name	Symposium on Determining Nanoscale Physical Properties of Materials by Microscopy and Spectroscopy
Publication Date	1994
Volume	332
Pages	525-530
Series Title	Materials Research Society Symposium Proceedings.
Series ISSN	0272-9172
DOI	https://doi.org/10.1557/proc-332-525
Public URL	https://durham-repository.worktribe.com/output/1680480

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