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Grazing Incidence X-ray Reflectance Measurement Of Surface And Interface Roughness On The Sub-nanometre Scale

Wormington, M; Sakurai, K; Bowen, DK; Tanner, BK

Authors

M Wormington

K Sakurai

DK Bowen



Contributors

M. Sarikaya
Editor

H.K. Wickramasinghe
Editor

M. Isaacson
Editor

Citation

Wormington, M., Sakurai, K., Bowen, D., & Tanner, B. (1994). Grazing Incidence X-ray Reflectance Measurement Of Surface And Interface Roughness On The Sub-nanometre Scale. In M. Sarikaya, H. Wickramasinghe, & M. Isaacson (Eds.), . https://doi.org/10.1557/proc-332-525

Conference Name Symposium on Determining Nanoscale Physical Properties of Materials by Microscopy and Spectroscopy
Conference Location Boston
Publication Date 1994
Volume 332
Pages 525-530
Series Title Materials Research Society Symposium Proceedings.
Series ISSN 0272-9172
DOI https://doi.org/10.1557/proc-332-525
Public URL https://durham-repository.worktribe.com/output/1680480


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