X-ray Scattering from Spintronic Structures

Tanner, BK

Abstract

The principles and underlying physics of grazing-incidence X-ray scattering are outlined in the context of application to the study of room temperature spintronic systems. Examples are presented showing the precision and reliability of analysis. The use of diffuse scatter measurements to separate topological roughness from chemical intermixing at interfaces is described. Extension of the physics to soft X-ray reflectivity under both linear and circularly polarized beams is discussed and the link to high-resolution X-ray diffraction of single crystal spintronic structures highlighted.

Citation

Tanner, B. (2016). X-ray Scattering from Spintronic Structures. In Y. Xu, D. D. Awschalom, & J. Nitta (Eds.), Handbook of Spintronics (919-945). Springer Netherlands. https://doi.org/10.1007/978-94-007-6892-5_33

• Publication Date: 2016
• Deposit Date: Dec 2, 2015
• Publisher: Springer Netherlands
• Pages: 919-945
• Book Title: Handbook of Spintronics
• Chapter Number: 23
• ISBN: 978-94-007-6891-8
• DOI: https://doi.org/10.1007/978-94-007-6892-5_33
• Public URL: https://durham-repository.worktribe.com/output/1644145
• Contract Date: Dec 2, 2015