T.P.A. Hase
Comparison of interface structure of thin miscible films by grazing incidence x-ray scattering and high-resolution electron microscopy
Hase, T.P.A.; Ho, E.M.; Freijo, J.-J.; Thompson, S.M.; Petford-Long, A.K.; Tanner, B.K.
Authors
E.M. Ho
J.-J. Freijo
S.M. Thompson
A.K. Petford-Long
Brian Tanner b.k.tanner@durham.ac.uk
Conducting Exam Musician
Citation
Hase, T., Ho, E., Freijo, J., Thompson, S., Petford-Long, A., & Tanner, B. (2003). Comparison of interface structure of thin miscible films by grazing incidence x-ray scattering and high-resolution electron microscopy. Journal of Physics D: Applied Physics, 36, A231-A235
| Journal Article Type | Article |
|---|---|
| Publication Date | 2003 |
| Journal | Journal of Physics D Applied Physics |
| Print ISSN | 0022-3727 |
| Publisher | IOP Publishing |
| Volume | 36 |
| Pages | A231-A235 |
| Public URL | https://durham-repository.worktribe.com/output/1619017 |
| Publisher URL | http://adsabs.harvard.edu/cgi-bin/nph-bib_query?bibcode=2003JPhD...36A.231H&db_key=PHY |
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