M.G. Beghi
Combined surface Brillouin scattering and x-ray reflectivity characterization of thin metallic films
Beghi, M.G.; Bottani, C.E.; Ossi, P.M.; Lafford, T.A.; Tanner, ,; K., B.
Authors
C.E. Bottani
P.M. Ossi
T.A. Lafford
, Tanner
B. K.
Citation
Beghi, M., Bottani, C., Ossi, P., Lafford, T., Tanner, ,., & K., B. (1997). Combined surface Brillouin scattering and x-ray reflectivity characterization of thin metallic films. Journal of Applied Physics, 81, 672-678
| Journal Article Type | Article |
|---|---|
| Publication Date | 1997 |
| Journal | Journal of Applied Physics |
| Print ISSN | 0021-8979 |
| Publisher | American Institute of Physics |
| Volume | 81 |
| Pages | 672-678 |
| Publisher URL | http://adsabs.harvard.edu/cgi-bin/nph-bib_query?bibcode=1997JAP....81..672B&db_key=PHY |
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