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Combined surface Brillouin scattering and x-ray reflectivity characterization of thin metallic films

Beghi, M.G.; Bottani, C.E.; Ossi, P.M.; Lafford, T.A.; Tanner, ,; K., B.

Authors

M.G. Beghi

C.E. Bottani

P.M. Ossi

T.A. Lafford

B. K.



Citation

Beghi, M., Bottani, C., Ossi, P., Lafford, T., Tanner, ,., & K., B. (1997). Combined surface Brillouin scattering and x-ray reflectivity characterization of thin metallic films. Journal of Applied Physics, 81, 672-678

Journal Article Type Article
Publication Date 1997
Journal Journal of Applied Physics
Print ISSN 0021-8979
Electronic ISSN 1089-7550
Publisher American Institute of Physics
Volume 81
Pages 672-678
Public URL https://durham-repository.worktribe.com/output/1618621
Publisher URL http://adsabs.harvard.edu/cgi-bin/nph-bib_query?bibcode=1997JAP....81..672B&db_key=PHY



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