TW Ryan
Characterization Of Nanometer-scale Epitaxial Structures By Grazing-incidence X-ray-scattering
Ryan, TW; Lucas, C; Hatton, PD; Bates, S
Citation
Ryan, T., Lucas, C., Hatton, P., & Bates, S. (1987). Characterization Of Nanometer-scale Epitaxial Structures By Grazing-incidence X-ray-scattering. Journal de physique (Paris), 48, 109-111
| Journal Article Type | Article |
|---|---|
| Publication Date | 1987 |
| Journal | Journal de physique. |
| Print ISSN | 0302-0738 |
| Publisher | EDITIONS PHYSIQUE |
| Volume | 48 |
| Pages | 109-111 |
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