X-ray topography of the coherency breakdown in GexSi1 - x/Si(100)

Eaglesham, D.J.; Kvam, E.P.; Maher, D.M.; Humphreys, C.J.; Green, G.S.; Tanner, B.K.; Bean, J.C.

X-ray topography of the coherency breakdown in GexSi1 - x/Si(100)

Eaglesham, D.J.; Kvam, E.P.; Maher, D.M.; Humphreys, C.J.; Green, G.S.; Tanner, B.K.; Bean, J.C.

Authors

D.J. Eaglesham

E.P. Kvam

D.M. Maher

C.J. Humphreys

G.S. Green

Brian Tanner b.k.tanner@durham.ac.uk
Conducting Exam Musician

J.C. Bean

Citation

Eaglesham, D., Kvam, E., Maher, D., Humphreys, C., Green, G., Tanner, B., & Bean, J. (1988). X-ray topography of the coherency breakdown in GexSi1 - x/Si(100). Applied Physics Letters, 53, 2083-2085

Journal Article Type	Article
Publication Date	1988
Journal	Applied Physics Letters
Print ISSN	0003-6951
Electronic ISSN	1077-3118
Publisher	American Institute of Physics
Volume	53
Pages	2083-2085
Public URL	https://durham-repository.worktribe.com/output/1611003
Publisher URL	http://adsabs.harvard.edu/cgi-bin/nph-bib_query?bibcode=1988ApPhL..53.2083E&db_key=PHY