T.A. Lafford
Direct measurement of twist mosaic in GaN epitaxial films as a function of growth temperature
Lafford, T.A.; Tanner, B.K.; Parbrook, P.J.
Citation
Lafford, T., Tanner, B., & Parbrook, P. (2003). Direct measurement of twist mosaic in GaN epitaxial films as a function of growth temperature. Journal of Physics D: Applied Physics, 36, A245-A248
| Journal Article Type | Article |
|---|---|
| Publication Date | 2003 |
| Journal | Journal of Physics D Applied Physics |
| Print ISSN | 0022-3727 |
| Electronic ISSN | 1361-6463 |
| Publisher | IOP Publishing |
| Volume | 36 |
| Pages | A245-A248 |
| Public URL | https://durham-repository.worktribe.com/output/1588004 |
| Publisher URL | http://adsabs.harvard.edu/cgi-bin/nph-bib_query?bibcode=2003JPhD...36A.245L&db_key=PHY |
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