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Variable wavelength grazing incidence x-ray reflectivity measurements of structural changes on annealing Cu/NiFe multilayers

Luo, G.M.; Mai, Z.H.; Hase, T.P.A.; Fulthorpe, B.D.; Tanner, B.K.; Marrows, C.H.; Hickey, B.J.

Authors

G.M. Luo

Z.H. Mai

T.P.A. Hase

B.D. Fulthorpe

C.H. Marrows

B.J. Hickey



Citation

Luo, G., Mai, Z., Hase, T., Fulthorpe, B., Tanner, B., Marrows, C., & Hickey, B. (2001). Variable wavelength grazing incidence x-ray reflectivity measurements of structural changes on annealing Cu/NiFe multilayers. Physical Review B, 64, 245404-

Journal Article Type Article
Publication Date 2001
Journal Physical Review B
Print ISSN 2469-9950
Electronic ISSN 2469-9969
Publisher American Physical Society
Volume 64
Pages 245404-
Public URL https://durham-repository.worktribe.com/output/1587937
Publisher URL http://adsabs.harvard.edu/cgi-bin/nph-bib_query?bibcode=2001PhRvB..64x5404L&db_key=PHY



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