C.D. Moore
Triple-axis X-ray diffraction study of polishing damage in III-V semiconductors
Moore, C.D.; Pape, I.; Tanner, B.K.
Citation
Moore, C., Pape, I., & Tanner, B. (1997). Triple-axis X-ray diffraction study of polishing damage in III-V semiconductors
| Journal Article Type | Article |
|---|---|
| Publication Date | 1997 |
| Journal | Nuovo Cimento D Serie |
| Volume | 19 |
| Pages | 205- |
| Public URL | https://durham-repository.worktribe.com/output/1587657 |
| Publisher URL | http://adsabs.harvard.edu/cgi-bin/nph-bib_query?bibcode=1997NCimD..19..205M&db_key=PHY |
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