Electron-beam damage of C₆₀ films on hydrogen-passivated Si(100)

Hunt, Michael R.C.; Schmidt, Jens; Palmer, Richard E.

doi:10.1063/1.120725

Electron-beam damage of C₆₀ films on hydrogen-passivated Si(100)

Hunt, Michael R.C.; Schmidt, Jens; Palmer, Richard E.

Authors

Dr Michael Hunt m.r.c.hunt@durham.ac.uk
Associate Professor

Jens Schmidt

Richard E. Palmer

Citation

Hunt, M. R., Schmidt, J., & Palmer, R. E. (1998). Electron-beam damage of C₆₀ films on hydrogen-passivated Si(100). Applied Physics Letters, 72, 323-325. https://doi.org/10.1063/1.120725

Journal Article Type	Article
Publication Date	1998
Journal	Applied Physics Letters
Print ISSN	0003-6951
Electronic ISSN	1077-3118
Publisher	American Institute of Physics
Volume	72
Pages	323-325
DOI	https://doi.org/10.1063/1.120725
Publisher URL	http://adsabs.harvard.edu/cgi-bin/nph-bib_query?bibcode=1998ApPhL..72..323H&db_key=PHY

Few-layer graphene as an ‘active’ conductive additive for flexible aqueous supercapacitor electrodes (2023)
Journal Article

Materials for Sodium-Ion Batteries (2020)
Book Chapter

Na-Ion Batteries (2020)
Book Chapter

Current State and Future Prospects for Electrochemical Energy Storage and Conversion Systems (2020)
Journal Article

Pseudocapacitive Effect of Carbons Doped with Different Functional Groups as Electrode Materials for Electrochemical Capacitors (2020)
Journal Article

Downloadable Citations

HTML

BIB

RTF

Authors

Citation

You might also like

Downloadable Citations