Electron-beam damage of C₆₀ films on hydrogen-passivated Si(100)

Hunt, Michael R.C.; Schmidt, Jens; Palmer, Richard E.

doi:10.1063/1.120725

Electron-beam damage of C₆₀ films on hydrogen-passivated Si(100)

Hunt, Michael R.C.; Schmidt, Jens; Palmer, Richard E.

Authors

Dr Michael Hunt m.r.c.hunt@durham.ac.uk
Associate Professor

Jens Schmidt

Richard E. Palmer

Citation

Hunt, M. R., Schmidt, J., & Palmer, R. E. (1998). Electron-beam damage of C₆₀ films on hydrogen-passivated Si(100). Applied Physics Letters, 72, 323-325. https://doi.org/10.1063/1.120725

Journal Article Type	Article
Publication Date	1998
Journal	Applied Physics Letters
Print ISSN	0003-6951
Electronic ISSN	1077-3118
Publisher	American Institute of Physics
Volume	72
Pages	323-325
DOI	https://doi.org/10.1063/1.120725
Public URL	https://durham-repository.worktribe.com/output/1582290
Publisher URL	http://adsabs.harvard.edu/cgi-bin/nph-bib_query?bibcode=1998ApPhL..72..323H&db_key=PHY

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