MAG Halliwell
Assessment Of Epitaxial Layers By Automated Scanning Double Axis Diffractometry
Halliwell, MAG; Lyons, MH; Tanner, BK; Ilczyszyn, P
Citation
Halliwell, M., Lyons, M., Tanner, B., & Ilczyszyn, P. (1983). Assessment Of Epitaxial Layers By Automated Scanning Double Axis Diffractometry. Journal of Crystal Growth, 65, 672-678
| Journal Article Type | Article |
|---|---|
| Publication Date | 1983 |
| Journal | Journal of Crystal Growth |
| Print ISSN | 0022-0248 |
| Publisher | Elsevier |
| Volume | 65 |
| Pages | 672-678 |
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