MAG Halliwell
Assessment Of Epitaxial Layers By Automated Scanning Double Axis Diffractometry
Halliwell, MAG; Lyons, MH; Tanner, BK; Ilczyszyn, P
Citation
Halliwell, M., Lyons, M., Tanner, B., & Ilczyszyn, P. (1983). Assessment Of Epitaxial Layers By Automated Scanning Double Axis Diffractometry. Journal of Crystal Growth, 65, 672-678
Journal Article Type | Article |
---|---|
Publication Date | 1983 |
Journal | Journal of Crystal Growth |
Print ISSN | 0022-0248 |
Electronic ISSN | 1873-5002 |
Publisher | Elsevier |
Volume | 65 |
Pages | 672-678 |
Public URL | https://durham-repository.worktribe.com/output/1579789 |
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