Interface stability in CoFe and CoFeB based multilayers

Pym, A.T.G.; Lamperti, A.; Cardoso, S.; Freitas, P.P.; Tanner, B.K.

Abstract

We report grazing incidence x-ray scattering measurements made during in situ annealing of multilayers based on CoFe and CoFeB. The layer and interface structure of Co80Fe20/Ru superlattices grown on Si/Al2O3 were found to be stable at all temperatures up to 400ºC. In contrast, Co64Fe16B20/Ru superlattices, also grown on Si/Al2O3 showed loss of Kiessig fringe visibility above 270C but no evidence of Co64Fe16B20/Ru interface roughening on recrystallization of the Co64Fe16B20. We associate the changes in Kiessig fringe amplitude with increase in interface width, partly due to increase in the topological roughness, measured from the diffuse scatter away from the Bragg peaks, at the bottom Co64Fe16B20/Al2O3 interface. © 2006 Elsevier Ltd. All rights reserved.

Citation

Pym, A., Lamperti, A., Cardoso, S., Freitas, P., & Tanner, B. (2007). Interface stability in CoFe and CoFeB based multilayers. Superlattices and Microstructures, 41, 122-126

• Journal Article Type: Article
• Publication Date: 2007
• Journal: Superlattices and Microstructures
• Print ISSN: 0749-6036
• Electronic ISSN: 1096-3677
• Publisher: Elsevier
• Peer Reviewed: Peer Reviewed
• Volume: 41
• Pages: 122-126
• Public URL: https://durham-repository.worktribe.com/output/1562079