R Fan
Ferromagnetism at the interfaces of antiferromagnetic FeRh epilayers
Fan, R; Kinane, CJ; Charlton, TR; Dorner, R; Ali, M; de Vries, MA; Brydson, RMD; Marrows, CH; Hickey, BJ; Arena, DA; Tanner, BK; Nisbet, G; Langridge, S
Authors
CJ Kinane
TR Charlton
R Dorner
M Ali
MA de Vries
RMD Brydson
CH Marrows
BJ Hickey
DA Arena
BK Tanner
G Nisbet
S Langridge
Abstract
The nanoscale magnetic structure of FeRh epilayers has been studied by polarized neutron reflectometry. Epitaxial films with a nominal thickness of 500 Å were grown on MgO (001) substrates via molecular-beam epitaxy and capped with 20 Å of MgO. The FeRh films show a clear transition from the antiferromagnetic (AF) state to the ferromagnetic (FM) state with increasing temperature. Surprisingly the films possess a FM moment even at a temperature 80 K below the AF-FM transition temperature of the film. We have quantified the magnitude and spatial extent of this FM moment, which is confined to within ∼60–80 Å of the FeRh near the top and bottom interfaces. These interfacial FM layers account for the unusual effects previously observed in films with thickness <100 Å. Given the delicate energy balance between the AF and FM ground states we suggest a metastable FM state resides near to the interface within an AF matrix. The length scale over which the FM region resides is consistent with the strained regions of the film.
Citation
Fan, R., Kinane, C., Charlton, T., Dorner, R., Ali, M., de Vries, M., …Langridge, S. (2010). Ferromagnetism at the interfaces of antiferromagnetic FeRh epilayers. Physical review B, 82(18), Article 184418. https://doi.org/10.1103/physrevb.82.184418
Journal Article Type | Article |
---|---|
Publication Date | Nov 1, 2010 |
Deposit Date | Jun 24, 2011 |
Publicly Available Date | Nov 27, 2012 |
Journal | Physical Review B |
Print ISSN | 1098-0121 |
Electronic ISSN | 1550-235X |
Publisher | American Physical Society |
Peer Reviewed | Peer Reviewed |
Volume | 82 |
Issue | 18 |
Article Number | 184418 |
DOI | https://doi.org/10.1103/physrevb.82.184418 |
Keywords | Thin-films, Metal-alloys, Multilayers, Transition, Pressure, RH |
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Copyright Statement
© 2010 The American Physical Society
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