New SPM techniques for analyzing OPV materials

Giridharagopal, R.; Shao, G.; Groves, C.; Ginger, D.S.

Abstract

Organic solar cells hold promise as an economical means of harvesting solar energy due to their ease of production and processing. However, the efficiency of such organic photovoltaic (OPV) devices is currently below that required for widespread adoption. The efficiency of an OPV is inextricably linked to its nanoscale morphology. High-resolution metrology can play a key role in the discovery and optimization of new organic semiconductors in the lab, as well as assist the transition of OPVs from the lab to mass production. We review the instrumental issues associated with the application of scanning probe microscopy (SPM) techniques such as photoconductive atomic force microscopy and time-resolved electrostatic force microscopy that have been shown to be useful in the study of nanostructured organic solar cells. These techniques offer unique insight into the underlying heterogeneity of OPV devices and provide a nanoscale basis for understanding how morphology directly affects OPV operation. Finally, we discuss opportunities for further improvements in scanning probe microscopy to contribute to OPV development.

Citation

Giridharagopal, R., Shao, G., Groves, C., & Ginger, D. (2010). New SPM techniques for analyzing OPV materials. Materials Today, 13(9), 50-56. https://doi.org/10.1016/s1369-7021%2810%2970165-6

• Journal Article Type: Article
• Publication Date: 2010-09
• Deposit Date: Oct 5, 2010
• Journal: Materials Today
• Print ISSN: 1369-7021
• Electronic ISSN: 1369-7021
• Publisher: Elsevier
• Peer Reviewed: Peer Reviewed
• Volume: 13
• Issue: 9
• Pages: 50-56
• DOI: https://doi.org/10.1016/s1369-7021%2810%2970165-6
• Public URL: https://durham-repository.worktribe.com/output/1538981