Skip to main content

Research Repository

Advanced Search

Temperature dependence of impact ionization in GaAs

Groves, C; Ghin, R; David, JPR; Rees, GJ

Authors

R Ghin

JPR David

GJ Rees



Citation

Groves, C., Ghin, R., David, J., & Rees, G. (2003). Temperature dependence of impact ionization in GaAs. IEEE Transactions on Electron Devices, 50(10), 2027-2031

Journal Article Type Article
Publication Date 2003-10
Journal IEEE Transactions on Electron Devices
Print ISSN 0018-9383
Electronic ISSN 1557-9646
Publisher Institute of Electrical and Electronics Engineers
Volume 50
Issue 10
Pages 2027-2031
Keywords avalanche diodes; avalanche photodiodes; impact ionization; ionization coefficients; semiconductor materials measurements; temperature dependenceAVALANCHE MULTIPLICATION; BREAKDOWN VOLTAGE; SIMPLE-MODEL; COEFFICIENTS; PHOTODIODES; ALXGA1-XAS; DIODES; NOIS
Public URL https://durham-repository.worktribe.com/output/1526020