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Defect motifs for constant mean curvature surfaces

Kusumaatmaja, H.; Wales, D.J.

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D.J. Wales


The energy landscapes of electrostatically charged particles embedded on constant mean curvature surfaces are analyzed for a wide range of system size, curvature, and interaction potentials. The surfaces are taken to be rigid, and the basin-hopping method is used to locate the putative global minimum structures. The defect motifs favored by potential energy agree with experimental observations for colloidal systems: extended defects (scars and pleats) for weakly positive and negative Gaussian curvatures, and isolated defects for strongly negative Gaussian curvatures. Near the phase boundary between these regimes, the two motifs are in strong competition, as evidenced from the appearance of distinct funnels in the potential energy landscape. We also report a novel defect motif consisting of pentagon pairs.


Kusumaatmaja, H., & Wales, D. (2013). Defect motifs for constant mean curvature surfaces. Physical Review Letters, 110(16), Article 165502.

Journal Article Type Article
Publication Date Apr 1, 2013
Deposit Date May 9, 2013
Publicly Available Date Jul 11, 2014
Journal Physical Review Letters
Print ISSN 0031-9007
Electronic ISSN 1079-7114
Publisher American Physical Society
Peer Reviewed Peer Reviewed
Volume 110
Issue 16
Article Number 165502


Published Journal Article (663 Kb)

Copyright Statement
Reprinted with permission from the American Physical Society: Phys. Rev. Lett. 110, 165502 © (2013) by the American Physical Society. Readers may view, browse, and/or download material for temporary copying purposes only, provided these uses are for noncommercial personal purposes. Except as provided by law, this material may not be further reproduced, distributed, transmitted, modified, adapted, performed, displayed, published, or sold in whole or part, without prior written permission from the American Physical Society.

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