Professor Buddhika Mendis b.g.mendis@durham.ac.uk
Professor
Two important applications of electron vortex beams are in electron magnetic chiral dichroism (EMCD) measurements and nanoparticle manipulation. In both cases orbital angular momentum (〈Lz〉) transfer between the vortex beam and the specimen due to dynamic scattering is critical. In general the 〈Lz〉 pendellösung consists of short and long wavelength oscillations. The former is due to interference between the tightly bound 1s and more dispersive non-1s Bloch states, while the latter is due to interference between the non-1s states. For EMCD experiments with ±ħ angular momentum beams, momentum transfer can be minimised by selecting the appropriate aperture size, so that the probe wavefunction approximately matches that of the 2p-type Bloch states. For manipulating nanoparticles with large angular momentum beams small apertures are required to excite the 1s state and thereby enhance the short wavelength oscillations in 〈Lz〉. This enables efficient momentum transfer to the specimen, provided the nanoparticle dimension corresponds to a minimum in the 〈Lz〉 pendellösung.
Mendis, B. (2015). Dynamic scattering of electron vortex beams – A Bloch wave analysis. Ultramicroscopy, 149, 74-85. https://doi.org/10.1016/j.ultramic.2014.11.001
Journal Article Type | Article |
---|---|
Acceptance Date | Nov 6, 2014 |
Online Publication Date | Nov 10, 2014 |
Publication Date | Feb 1, 2015 |
Deposit Date | Dec 10, 2014 |
Publicly Available Date | Dec 11, 2014 |
Journal | Ultramicroscopy |
Print ISSN | 0304-3991 |
Electronic ISSN | 1879-2723 |
Publisher | Elsevier |
Peer Reviewed | Peer Reviewed |
Volume | 149 |
Pages | 74-85 |
DOI | https://doi.org/10.1016/j.ultramic.2014.11.001 |
Keywords | Electron vortex beams, Angular momentum, Electron magnetic chiral dichroism (EMCD), Nanoparticle manipulation. |
Public URL | https://durham-repository.worktribe.com/output/1440211 |
Accepted Journal Article
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Copyright Statement
NOTICE: this is the author’s version of a work that was accepted for publication in Ultramicroscopy. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. A definitive version was subsequently published in Ultramicroscopy, 149, February 2015, 10.1016/j.ultramic.2014.11.001.
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