Z. Racz
Nanofabrication using nanotranslated stencil masks and lift off
Racz, Z.; He, J.L.; Srinivasan, S.; Zhao, W.; Seabaugh, A.; Han, K.P.; Ruchhoeft, P.; Wolfe, J.
Authors
J.L. He
S. Srinivasan
W. Zhao
A. Seabaugh
K.P. Han
P. Ruchhoeft
J. Wolfe
Abstract
We propose and demonstrate a technique for forming nanometer-scale metal features based on evaporation onto a substrate through a stencil mask. In this work, the stencil mask is laterally translated by a piezoflexure stage, between evaporations of different metals. The metals are chosen based on their etch chemistry to allow one material to be lifted off with respect to another. In this way, sidewall features are formed with dimensions and spacings controlled by moving the translational stage, which has 1 nm resolution.
Citation
Racz, Z., He, J., Srinivasan, S., Zhao, W., Seabaugh, A., Han, K., …Wolfe, J. (2004). Nanofabrication using nanotranslated stencil masks and lift off. Journal of Vacuum Science and Technology B, 22(1), 74-76. https://doi.org/10.1116/1.1637916
Journal Article Type | Article |
---|---|
Acceptance Date | Nov 10, 2003 |
Online Publication Date | Jan 14, 2004 |
Publication Date | Jan 14, 2004 |
Deposit Date | Oct 8, 2015 |
Publicly Available Date | Nov 23, 2017 |
Journal | Journal of Vacuum Science and Technology B |
Print ISSN | 2166-2746 |
Electronic ISSN | 2166-2754 |
Publisher | American Institute of Physics |
Peer Reviewed | Peer Reviewed |
Volume | 22 |
Issue | 1 |
Pages | 74-76 |
DOI | https://doi.org/10.1116/1.1637916 |
Public URL | https://durham-repository.worktribe.com/output/1421200 |
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Copyright Statement
© 2004 American Vacuum Society. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Racz, Z., He, J. L., Srinivasan, S., Zhao, W., Seabaugh, A., Han, K. P., Ruchhoeft, P. & Wolfe, J. (2004). Nanofabrication using nanotranslated stencil masks and lift off. Journal of Vacuum Science & Technology B 22(1): 74-76 and may be found at https://doi.org/10.1116/1.1637916
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