R. McWilliam
Experimental validation of a resilient electronic logic design with autonomous fault discrimination/masking
McWilliam, R.; Schiefer, P.; Purvis, A.
Abstract
This paper presents the experimental validation of a novel fault-tolerant electronic logic design conducted by an automated mixed-signal fault injection procedure. The design under evaluation relies upon a novel redundant design strategy intended to provide fault discrimination and selective fault masking embedded within a functional CMOS NAND gate. The traditional logic layout is modified to include fault detection and reporting at an extremely fine-grained design level with 2x overhead as opposed to the traditional 4x overhead. The fault injection test bench procedure requires automated fault injection, programmable fault load conditions and combined analogue/digital domain verification. The device under test is implemented using discrete n- and p-FETs arranged as a modular test board together with automated fault injection and test lines. The fault response is measured and confirms the predicted intrinsic fault rate of 25% with a successful 100% masking of suck low-faults and precise identification of stuck-high via IDDQ trigger. The test procedure is shown to be extensible towards more complex logic unit designs and for evaluation of multiple simultaneous faults.
Journal Article Type | Article |
---|---|
Acceptance Date | Aug 12, 2015 |
Publication Date | Oct 27, 2015 |
Deposit Date | Dec 11, 2015 |
Publicly Available Date | Dec 11, 2015 |
Journal | Procedia CIRP |
Print ISSN | 2212-8271 |
Publisher | Elsevier |
Peer Reviewed | Peer Reviewed |
Volume | 38 |
Pages | 265-270 |
DOI | https://doi.org/10.1016/j.procir.2015.08.027 |
Keywords | Self-healing technologies, FPGA, Hardware-in-loop, Fault injection, Fault-tolerance. |
Public URL | https://durham-repository.worktribe.com/output/1396400 |
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http://creativecommons.org/licenses/by-nc-nd/4.0/
Copyright Statement
© 2015 The Authors. Published by Elsevier B.V. This is an open access article under the CC BY-NC-ND license.
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