Experimental validation of a resilient electronic logic design with autonomous fault discrimination/masking

McWilliam, R.; Schiefer, P.; Purvis, A.

Abstract

This paper presents the experimental validation of a novel fault-tolerant electronic logic design conducted by an automated mixed-signal fault injection procedure. The design under evaluation relies upon a novel redundant design strategy intended to provide fault discrimination and selective fault masking embedded within a functional CMOS NAND gate. The traditional logic layout is modified to include fault detection and reporting at an extremely fine-grained design level with 2x overhead as opposed to the traditional 4x overhead. The fault injection test bench procedure requires automated fault injection, programmable fault load conditions and combined analogue/digital domain verification. The device under test is implemented using discrete n- and p-FETs arranged as a modular test board together with automated fault injection and test lines. The fault response is measured and confirms the predicted intrinsic fault rate of 25% with a successful 100% masking of suck low-faults and precise identification of stuck-high via IDDQ trigger. The test procedure is shown to be extensible towards more complex logic unit designs and for evaluation of multiple simultaneous faults.

Citation

McWilliam, R., Schiefer, P., & Purvis, A. (2015). Experimental validation of a resilient electronic logic design with autonomous fault discrimination/masking. Procedia CIRP, 38, 265-270. https://doi.org/10.1016/j.procir.2015.08.027

• Journal Article Type: Article
• Acceptance Date: Aug 12, 2015
• Publication Date: Oct 27, 2015
• Deposit Date: Dec 11, 2015
• Publicly Available Date: Dec 11, 2015
• Journal: Procedia CIRP
• Print ISSN: 2212-8271
• Publisher: Elsevier
• Peer Reviewed: Peer Reviewed
• Volume: 38
• Pages: 265-270
• DOI: https://doi.org/10.1016/j.procir.2015.08.027
• Keywords: Self-healing technologies, FPGA, Hardware-in-loop, Fault injection, Fault-tolerance.
• Public URL: https://durham-repository.worktribe.com/output/1396400