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Electron Compton scattering and the measurement of electron momentum distributions in solids

Talmantaite, A.; Hunt, M.R.C.; Mendis, B.G.

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Authors

A. Talmantaite



Abstract

Electron Compton scattering is a technique that gives information on the electron momentum density of states and is used to characterize the ground state electronic structure in solids. Extracting the momentum density of states requires us to assume the so‐called ‘impulse approximation’, which is valid for large energy losses. Here, the robustness of the impulse approximation in the low energy transfer regime is tested and confirmed on amorphous carbon films. Compared to traditional Compton measurements, this provides additional benefits of more efficient data collection and a simplified way to probe valence electrons, which govern solid state bonding. However, a potential complication is the increased background from the plasmon signal. To overcome this, a novel plasmon background subtraction routine is proposed for samples that are resistant to beam damage.

Journal Article Type Article
Acceptance Date Dec 7, 2019
Online Publication Date Jan 6, 2020
Publication Date 2020-09
Deposit Date Jan 10, 2020
Publicly Available Date Jan 10, 2020
Journal Journal of Microscopy
Print ISSN 0022-2720
Electronic ISSN 1365-2818
Publisher Wiley
Peer Reviewed Peer Reviewed
Volume 279
Issue 3
Pages 185-188
DOI https://doi.org/10.1111/jmi.12854
Public URL https://durham-repository.worktribe.com/output/1274226

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Published Journal Article (Advance online version) (968 Kb)
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Publisher Licence URL
http://creativecommons.org/licenses/by/4.0/

Copyright Statement
Advance online version © The Authors. Journal of Microscopy published by John Wiley & Sons Ltd on behalf of Royal Microscopical Society.
This is an open access article under the terms of the Creative Commons Attribution License, which permits use, distribution and reproduction in any medium, provided the original work is properly cited.






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