Outputs (4)

High sensitivity love-mode liquid density sensors (2005)
Journal Article
Turton, A., Bhattacharyya, D., & Wood, D. (2005). High sensitivity love-mode liquid density sensors. Sensors and Actuators A: Physical, 123-24, 267-273. https://doi.org/10.1016/j.sna.2005.02.010

An experimental study into Love-mode liquid sensors using polyimide for a waveguide layer has been carried out. Love devices were built on Y-ST quartz with 40 μm wavelength inter-digitated transducers operating up to 124.7 MHz, and polyimide layers b... Read More about High sensitivity love-mode liquid density sensors.

Individually addressable recessed gold microelectrode arrays with monolayers of thio-cyclodextrin nanocavities (2005)
Journal Article
Grancharov, G., Khosravi, E., Wood, D., Turton, A., & Kataky, R. (2005). Individually addressable recessed gold microelectrode arrays with monolayers of thio-cyclodextrin nanocavities. Analyst, 130(10), 1351-1357. https://doi.org/10.1039/b506367a

Four, individually addressable 30 mu m diameter, e-beam deposited, gold microelectrodes recessed by 6 mm were suitably spaced on a single substrate to avoid diffusional overlap between each microelectrode. The single substrate device was functionalis... Read More about Individually addressable recessed gold microelectrode arrays with monolayers of thio-cyclodextrin nanocavities.

Surface micromachined membranes for wafer level packaging (2005)
Journal Article
Gallant, A., & Wood, D. (2005). Surface micromachined membranes for wafer level packaging. Journal of Micromechanics and Microengineering, 15(7), S47-S52. https://doi.org/10.1088/0960-1317/15/7/007

Novel surface micromachined membranes have been developed for wafer level packaging and polymer encapsulation. Laterally unconstrained electroforming allows small etch holes to be included in thick membranes whilst only requiring a thin, low stress,... Read More about Surface micromachined membranes for wafer level packaging.

Nanometer scale patterning using focused ion beam milling (2005)
Journal Article
Petit, D., Faulkner, C., Johnstone, S., Wood, D., & Cowburn, R. (2005). Nanometer scale patterning using focused ion beam milling. Review of Scientific Instruments, 76(2), Article 026105. https://doi.org/10.1063/1.1844431

We report on the performance of focused ion beam (FIB) milling in order to produce nanometer scale devices. Resolution issues have been systematically studied as a function of emission current and working distance, by imaging single pixel lines FIB m... Read More about Nanometer scale patterning using focused ion beam milling.