Long lifetime hole traps at grain boundaries in CdTe thin-film photovoltaics
(2015)
Journal Article
Mendis, B., Gachet, D., Major, J., & Durose, K. (2015). Long lifetime hole traps at grain boundaries in CdTe thin-film photovoltaics. Physical Review Letters, 115(21), Article 218701. https://doi.org/10.1103/physrevlett.115.218701
A novel time-resolved cathodoluminescence method, where a pulsed electron beam is generated via the photoelectric effect, is used to probe individual CdTe grain boundaries. Excitons have a short lifetime (≤100 ps ) within the grains and are rapidly... Read More about Long lifetime hole traps at grain boundaries in CdTe thin-film photovoltaics.