International Round-Robin Test of Critical Current of Superconducting Cable Sample

Matsushita, T.; Kiuchi, M.; Masuda, T.; Mukoyama, S.; Funaki, K.; Cho, J.; Lu, J.; Raine, M. J.; Quéval, L.; Trillaud, F.; Zhang, G.; Song, M.; Zheng, J.; Chen, Z.; Li, J.

Abstract

Ten institutes from six countries participated in an international round-robin test to evaluate the critical current of a superconducting power cable made of Bi-2223 tapes. The cable design featured a two-layer inner core conductor and a single-layer outer shield conductor. The shield layer measured approximately 40 mm in diameter, and the cable length was 2.0 m. To eliminate the influence of resistive voltage drops from current transfer, voltage taps for measurement were positioned at a sufficient distance from the current terminals. The critical current was determined using the resistive method with the electric field criterion of 1.0 μV/cm . In addition, the n -value, an optional parameter reflecting the current–voltage ( I – V ) characteristics, was extracted from the I – V curve within an electric field range of 0.1–1.0 μV/cm . A detailed uncertainty analysis was conducted for both the critical current and the n -value. Finally, this article discusses the potential for standardization of the employed resistive measurement method.

Citation

Matsushita, T., Kiuchi, M., Masuda, T., Mukoyama, S., Funaki, K., Cho, J., Lu, J., Raine, M. J., Quéval, L., Trillaud, F., Zhang, G., Song, M., Zheng, J., Chen, Z., & Li, J. (2024). International Round-Robin Test of Critical Current of Superconducting Cable Sample. IEEE Transactions on Applied Superconductivity, 34(7), 1-6. https://doi.org/10.1109/tasc.2024.3438251

• Journal Article Type: Article
• Acceptance Date: Aug 1, 2024
• Online Publication Date: Aug 5, 2024
• Publication Date: 2024-10
• Deposit Date: Nov 21, 2024
• Publicly Available Date: Nov 21, 2024
• Journal: IEEE Transactions on Applied Superconductivity
• Print ISSN: 1051-8223
• Electronic ISSN: 1558-2515
• Publisher: Institute of Electrical and Electronics Engineers
• Peer Reviewed: Peer Reviewed
• Volume: 34
• Issue: 7
• Pages: 1-6
• DOI: https://doi.org/10.1109/tasc.2024.3438251
• Public URL: https://durham-repository.worktribe.com/output/3102638