Teruo Matsushita
Round Robin Test of Residual Resistance Ratio of Nb3Sn Composite Superconductors
Matsushita, Teruo; Otabe, Edmund S.; Kim, Dongho; Hwang, Taejong; Gao, Huixian; Liu, Fang; Liu, Huajun; Cooley, Lance; Turrioni, Daniele; Raine, Mark J.; Hampshire, Damian P.
Authors
Edmund S. Otabe
Dongho Kim
Taejong Hwang
Huixian Gao
Fang Liu
Huajun Liu
Lance Cooley
Daniele Turrioni
Dr Mark Raine m.j.raine@durham.ac.uk
Chief Experimental Officer
Damian P. Hampshire
Citation
Matsushita, T., Otabe, E. S., Kim, D., Hwang, T., Gao, H., Liu, F., Liu, H., Cooley, L., Turrioni, D., Raine, M. J., & Hampshire, D. P. (2018). Round Robin Test of Residual Resistance Ratio of Nb3Sn Composite Superconductors. IEEE Transactions on Applied Superconductivity, 28(2), https://doi.org/10.1109/tasc.2017.2781182
Journal Article Type | Article |
---|---|
Acceptance Date | Nov 21, 2017 |
Online Publication Date | Mar 30, 2018 |
Publication Date | 2018 |
Deposit Date | Aug 30, 2018 |
Journal | IEEE Transactions on Applied Superconductivity |
Print ISSN | 1051-8223 |
Electronic ISSN | 1558-2515 |
Publisher | Institute of Electrical and Electronics Engineers |
Peer Reviewed | Peer Reviewed |
Volume | 28 |
Issue | 2 |
DOI | https://doi.org/10.1109/tasc.2017.2781182 |
Public URL | https://durham-repository.worktribe.com/output/1321103 |
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