A Knowledge-Based Analysis of Interlaminar Faults for Condition Monitoring of Magnetic Cores With Predominant Focus on Axial Offset Between the Fault Points

Hamzehbahmani, Hamed; Sabariego, Ruth V.; Ducharne, Benjamin

Abstract

Condition monitoring and fault diagnosis of electromagnetic devices is a normal practice to prevent unpredicted downtime and catastrophic failure. In this sense, interlaminar faults (ILFs) detection or fault diagnosis in the magnetic cores is a key objective. This article aims to present advanced experimental measurements and numerical analysis to study the influence of ILFs on soft magnetic properties of magnetic cores with grain-oriented electrical steels (GOES). The predominant focus of these studies and associated analysis is ILFs with axial offset between the short-circuit points. To carry out the experimental measurements, the stacks of four standard Epstein size strips of GOES were assembled. Each stack was subjected to minor ILF with axial offset from 0 to 200 mm. The test samples were magnetized under controlled sinusoidal induction at a frequency of 50 Hz and peak inductions of 1.1–1.7 T. The impacts of each fault scenario on soft magnetic properties of the test samples were investigated by monitoring and interpreting the dynamic hysteresis loops (DHLs). In favor of supporting the practical measurements, accurate time-domain finite element (FE) models were also undertaken to reproduce the DHLs and to visualize distribution of interlaminar eddy currents and power loss caused by ILFs.

Citation

Hamzehbahmani, H., Sabariego, R. V., & Ducharne, B. (2024). A Knowledge-Based Analysis of Interlaminar Faults for Condition Monitoring of Magnetic Cores With Predominant Focus on Axial Offset Between the Fault Points. IEEE Transactions on Instrumentation and Measurement, 73, 1-10. https://doi.org/10.1109/tim.2024.3375419

• Journal Article Type: Article
• Acceptance Date: Feb 18, 2024
• Online Publication Date: Mar 11, 2024
• Publication Date: 2024
• Deposit Date: Mar 26, 2024
• Publicly Available Date: Mar 27, 2024
• Journal: IEEE Transactions on Instrumentation and Measurement
• Print ISSN: 0018-9456
• Electronic ISSN: 1557-9662
• Publisher: Institute of Electrical and Electronics Engineers
• Peer Reviewed: Peer Reviewed
• Volume: 73
• Article Number: 3514710
• Pages: 1-10
• DOI: https://doi.org/10.1109/tim.2024.3375419
• Keywords: Electrical and Electronic Engineering; Instrumentation
• Public URL: https://durham-repository.worktribe.com/output/2347422