W. Ulrici
Optical, electrical and EPR studies of GaAs:Ni.
Ulrici, W.; Eaves, L.; Friedland, K.; Halliday, D.P.; Kreissl, J.; Ulrici, B.
Authors
L. Eaves
K. Friedland
Professor Douglas Halliday d.p.halliday@durham.ac.uk
Professor
J. Kreissl
B. Ulrici
Contributors
H.J. von Bardeleben
Editor
Citation
Ulrici, W., Eaves, L., Friedland, K., Halliday, D., Kreissl, J., & Ulrici, B. (1986). Optical, electrical and EPR studies of GaAs:Ni. In H. von Bardeleben (Ed.), Defects in Semiconductors 14. Proceedings of the 14th International Conference on Defects in Semiconductors (ICDS-14), Paris, France, 1986 (669-674). Trans Tech Publications
Publication Date | 1986 |
---|---|
Publisher | Trans Tech Publications |
Pages | 669-674 |
Series Number | 10-12 |
Book Title | Defects in Semiconductors 14. Proceedings of the 14th International Conference on Defects in Semiconductors (ICDS-14), Paris, France, 1986. |
Public URL | https://durham-repository.worktribe.com/output/1689591 |
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