SJ Miles
Assessment Of Thin Heteroepitaxial Layers Using Skew Angle Asymmetrical X-ray Double Crystal Diffraction
Miles, SJ; Green, GS; Tanner, BK; Halliwell, MAG; Lyons, MH
Authors
Citation
Miles, S., Green, G., Tanner, B., Halliwell, M., & Lyons, M. (1989). Assessment Of Thin Heteroepitaxial Layers Using Skew Angle Asymmetrical X-ray Double Crystal Diffraction. MRS proceedings, 138, 539-544
| Journal Article Type | Article |
|---|---|
| Publication Date | 1989 |
| Journal | Materials Research Society symposia proceedings |
| Print ISSN | 0272-9172 |
| Electronic ISSN | 1946-4274 |
| Publisher | North-Holland |
| Volume | 138 |
| Pages | 539-544 |
| Public URL | https://durham-repository.worktribe.com/output/1611410 |
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