IB Maccormack
Application Of X-ray Synchrotron Topography To Insitu Studies Of Recrystallization
Maccormack, IB; Tanner, BK
Authors
BK Tanner
Citation
Maccormack, I., & Tanner, B. (1978). Application Of X-ray Synchrotron Topography To Insitu Studies Of Recrystallization. Journal of Applied Crystallography, 11, 40-43
| Journal Article Type | Article |
|---|---|
| Publication Date | 1978 |
| Journal | Journal of Applied Crystallography |
| Print ISSN | 0021-8898 |
| Publisher | International Union of Crystallography |
| Volume | 11 |
| Pages | 40-43 |
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