IB Maccormack
Application Of X-ray Synchrotron Topography To Insitu Studies Of Recrystallization
Maccormack, IB; Tanner, BK
Citation
Maccormack, I., & Tanner, B. (1978). Application Of X-ray Synchrotron Topography To Insitu Studies Of Recrystallization. Journal of Applied Crystallography, 11, 40-43
| Journal Article Type | Article |
|---|---|
| Publication Date | 1978 |
| Journal | Journal of Applied Crystallography |
| Print ISSN | 0021-8898 |
| Publisher | International Union of Crystallography |
| Volume | 11 |
| Pages | 40-43 |
You might also like
Trepidation or Precession: The Turning Point in a Tradition
(2023)
Book Chapter
“In the shape of a cooking pot over the fire”: Records of solar prominences in the 1180s
(2023)
Journal Article
Commentary on the model of the world machine
(2023)
Book Chapter
X-ray Diffraction Topography (Imaging) of Crystals Grown from Solution: A Short Review
(2023)
Journal Article
A cooking pot lit by fire
(2023)
Journal Article
Downloadable Citations
About Durham Research Online (DRO)
Administrator e-mail: dro.admin@durham.ac.uk
This application uses the following open-source libraries:
SheetJS Community Edition
Apache License Version 2.0 (http://www.apache.org/licenses/)
PDF.js
Apache License Version 2.0 (http://www.apache.org/licenses/)
Font Awesome
SIL OFL 1.1 (http://scripts.sil.org/OFL)
MIT License (http://opensource.org/licenses/mit-license.html)
CC BY 3.0 ( http://creativecommons.org/licenses/by/3.0/)
Powered by Worktribe © 2024
Advanced Search