C.A. Lucas
Characterization of nanometer-scale epitaxial structures by grazing-incidence x-ray diffraction and specular reflectivity
Lucas, C.A.; Hatton, P.D.; Bates, S.; Ryan, T.W.; Miles, S.; Tanner, B.K.
Authors
Professor Peter Hatton p.d.hatton@durham.ac.uk
Emeritus Professor
S. Bates
T.W. Ryan
S. Miles
Brian Tanner b.k.tanner@durham.ac.uk
Conducting Exam Musician
Citation
Lucas, C., Hatton, P., Bates, S., Ryan, T., Miles, S., & Tanner, B. (1988). Characterization of nanometer-scale epitaxial structures by grazing-incidence x-ray diffraction and specular reflectivity. Journal of Applied Physics, 63, 1936-1941
| Journal Article Type | Article |
|---|---|
| Publication Date | 1988 |
| Journal | Journal of Applied Physics |
| Print ISSN | 0021-8979 |
| Electronic ISSN | 1089-7550 |
| Publisher | American Institute of Physics |
| Volume | 63 |
| Pages | 1936-1941 |
| Public URL | https://durham-repository.worktribe.com/output/1592191 |
| Publisher URL | http://adsabs.harvard.edu/cgi-bin/nph-bib_query?bibcode=1988JAP....63.1936L&db_key=PHY |
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