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Characterization of nanometer-scale epitaxial structures by grazing-incidence x-ray diffraction and specular reflectivity

Lucas, C.A.; Hatton, P.D.; Bates, S.; Ryan, T.W.; Miles, S.; Tanner, B.K.

Authors

C.A. Lucas

S. Bates

T.W. Ryan

S. Miles



Citation

Lucas, C., Hatton, P., Bates, S., Ryan, T., Miles, S., & Tanner, B. (1988). Characterization of nanometer-scale epitaxial structures by grazing-incidence x-ray diffraction and specular reflectivity. Journal of Applied Physics, 63, 1936-1941

Journal Article Type Article
Publication Date 1988
Journal Journal of Applied Physics
Print ISSN 0021-8979
Electronic ISSN 1089-7550
Publisher American Institute of Physics
Volume 63
Pages 1936-1941
Public URL https://durham-repository.worktribe.com/output/1592191
Publisher URL http://adsabs.harvard.edu/cgi-bin/nph-bib_query?bibcode=1988JAP....63.1936L&db_key=PHY