R Kapsa
AES and EELS study of aluminium oxide thin films
Kapsa, R; Stara, I; Zeze, D; Gruzza, B; Matolin, V
Citation
Kapsa, R., Stara, I., Zeze, D., Gruzza, B., & Matolin, V. (1998). AES and EELS study of aluminium oxide thin films. Thin Solid Films, 317(1-2), 77-80
| Journal Article Type | Article |
|---|---|
| Publication Date | 1998-04 |
| Journal | Thin Solid Films |
| Print ISSN | 0040-6090 |
| Publisher | Elsevier |
| Peer Reviewed | Peer Reviewed |
| Volume | 317 |
| Issue | 1-2 |
| Pages | 77-80 |
| Keywords | Auger electron spectroscopy, AES; electron energy loss spectroscopy,EELS; aluminium oxideSPECTROSCOPY |
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