DA Buchanan
Charge trapping in silicon-rich Si₃N₄ thin films.
Buchanan, DA; Abram, RA; Morant, MJ
Citation
Buchanan, D., Abram, R., & Morant, M. (1987). Charge trapping in silicon-rich Si₃N₄ thin films. Solid-State Electronics, 30, 1295-1301
| Journal Article Type | Article |
|---|---|
| Publication Date | 1987 |
| Journal | Solid-State Electronics |
| Print ISSN | 0038-1101 |
| Electronic ISSN | 1879-2405 |
| Publisher | Elsevier |
| Volume | 30 |
| Pages | 1295-1301 |
| Public URL | https://durham-repository.worktribe.com/output/1581039 |
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