DA Buchanan
Charge trapping in silicon-rich Si₃N₄ thin films.
Buchanan, DA; Abram, RA; Morant, MJ
Citation
Buchanan, D., Abram, R., & Morant, M. (1987). Charge trapping in silicon-rich Si₃N₄ thin films. Solid-State Electronics, 30, 1295-1301
Journal Article Type | Article |
---|---|
Publication Date | 1987 |
Journal | Solid-State Electronics |
Print ISSN | 0038-1101 |
Electronic ISSN | 1879-2405 |
Publisher | Elsevier |
Volume | 30 |
Pages | 1295-1301 |
Public URL | https://durham-repository.worktribe.com/output/1581039 |
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