P Mock
Critical Thickness Of Quantum-well Structures: Modified Matthews-blakeslee Formula And Experimental Support Gathered By Means Of Synchrotron X-ray Reflection Topography
Mock, P; Tanner, BK; Lacey, G; Whitehouse, CR; Smith, GW
Authors
Citation
Mock, P., Tanner, B., Lacey, G., Whitehouse, C., & Smith, G. (online). Critical Thickness Of Quantum-well Structures: Modified Matthews-blakeslee Formula And Experimental Support Gathered By Means Of Synchrotron X-ray Reflection Topography. Institute of physics conference series, 165-168
| Journal Article Type | Article |
|---|---|
| Journal | Institute of physics conference series. |
| Print ISSN | 0951-3248 |
| Electronic ISSN | 2154-6630 |
| Publisher | IOP Publishing |
| Pages | 165-168 |
| Public URL | https://durham-repository.worktribe.com/output/1580764 |
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