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Identification Of Misfit Dislocations Using X-ray Scattering And Topography

Tanner, BK; Mock, P; Mizuno, K

Authors

P Mock

K Mizuno



Citation

Tanner, B., Mock, P., & Mizuno, K. (1998). Identification Of Misfit Dislocations Using X-ray Scattering And Topography. Institute of physics conference series, 160, 177-186

Journal Article Type Article
Publication Date 1998
Journal Institute of physics conference series.
Print ISSN 0951-3248
Electronic ISSN 2154-6630
Publisher IOP Publishing
Volume 160
Pages 177-186
Public URL https://durham-repository.worktribe.com/output/1580392