JM Hudson
Thermal-degradation Of Sige Interfaces Studied By X-ray Reflectivity And Diffraction
Hudson, JM; Powell, AR; Bowen, DK; Wormington, M; Tanner, BK; Kubiak, RA; Parker, EHC
Authors
AR Powell
DK Bowen
M Wormington
Brian Tanner b.k.tanner@durham.ac.uk
Conducting Exam Musician
RA Kubiak
EHC Parker
Citation
Hudson, J., Powell, A., Bowen, D., Wormington, M., Tanner, B., Kubiak, R., & Parker, E. (1992). Thermal-degradation Of Sige Interfaces Studied By X-ray Reflectivity And Diffraction
| Journal Article Type | Article |
|---|---|
| Publication Date | 1992 |
| Journal | Thin Films : Stress And Mechanical Properties Iii |
| Volume | 239 |
| Pages | 455-460 |
| Public URL | https://durham-repository.worktribe.com/output/1579484 |
You might also like
Trepidation or Precession: The Turning Point in a Tradition
(2023)
Book Chapter
“In the shape of a cooking pot over the fire”: Records of solar prominences in the 1180s
(2023)
Journal Article
Commentary on the model of the world machine
(2023)
Book Chapter
X-ray Diffraction Topography (Imaging) of Crystals Grown from Solution: A Short Review
(2023)
Journal Article
A cooking pot lit by fire
(2023)
Journal Article
Downloadable Citations
About Durham Research Online (DRO)
Administrator e-mail: dro.admin@durham.ac.uk
This application uses the following open-source libraries:
SheetJS Community Edition
Apache License Version 2.0 (http://www.apache.org/licenses/)
PDF.js
Apache License Version 2.0 (http://www.apache.org/licenses/)
Font Awesome
SIL OFL 1.1 (http://scripts.sil.org/OFL)
MIT License (http://opensource.org/licenses/mit-license.html)
CC BY 3.0 ( http://creativecommons.org/licenses/by/3.0/)
Powered by Worktribe © 2024
Advanced Search