JM Hudson
Thermal-degradation Of Sige Interfaces Studied By X-ray Reflectivity And Diffraction
Hudson, JM; Powell, AR; Bowen, DK; Wormington, M; Tanner, BK; Kubiak, RA; Parker, EHC
Authors
AR Powell
DK Bowen
M Wormington
Professor Brian Tanner b.k.tanner@durham.ac.uk
Emeritus Professor
RA Kubiak
EHC Parker
Citation
Hudson, J., Powell, A., Bowen, D., Wormington, M., Tanner, B., Kubiak, R., & Parker, E. (1992). Thermal-degradation Of Sige Interfaces Studied By X-ray Reflectivity And Diffraction
| Journal Article Type | Article |
|---|---|
| Publication Date | 1992 |
| Journal | Thin Films : Stress And Mechanical Properties Iii |
| Volume | 239 |
| Pages | 455-460 |
| Public URL | https://durham-repository.worktribe.com/output/1579484 |
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