Role of substrate and transparent conducting oxide in impurity evolvement in polycrystalline thin-film devices
Emziane, M.; Durose, K.; Halliday, D.P.; Bosio, A.; Romeo, N.
Professor Douglas Halliday email@example.com
A comparison of as-grown and processed CdTe/CdS solar cell structures deposited on sapphire substrate has been undertaken with those grown on glass. The device structures were depth-profiled using quantitative secondary ion mass spectrometry. It was shown that while Si concentration profiles are similar to those for structures grown on glass, Na was more than one order of magnitude lower when sapphire was used instead of glass, showing that Na diffused from the glass. It was also found that there was no measurable diffusion of Sn from the SnO2 layer into CdTe, and that the former played an important role in preventing the diffusion of In from In-containing transparent conducting oxide layer. Cl, O, Br, and F species were also investigated and while Cl and O were found to be independent of the nature of the substrate used, Br and F were shown to be affected by the processing.
Emziane, M., Durose, K., Halliday, D., Bosio, A., & Romeo, N. (2005). Role of substrate and transparent conducting oxide in impurity evolvement in polycrystalline thin-film devices. Applied Physics Letters, 87(25), https://doi.org/10.1063/1.2149990
|Journal Article Type||Article|
|Publication Date||Dec 19, 2005|
|Deposit Date||Dec 4, 2006|
|Publicly Available Date||Apr 21, 2011|
|Journal||Applied Physics Letters|
|Publisher||American Institute of Physics|
|Peer Reviewed||Peer Reviewed|
Published Journal Article
© 2005 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Emziane, M. and Durose, K. and Halliday, D. P. and Bosio, A. and Romeo, N (2005) 'Role of substrate and transparent conducting oxide in impurity evolvement in polycrystalline thin-film devices.', Applied physics letters., 87 (25). p. 251913 and may be found at http://dx.doi.org/10.1063/1.2149990
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