WJ Lin
Observation of small interfacial strains in YBa2Cu3Ox sub-micron-thick films grown on SrTiO3 substrates
Lin, WJ; Hatton, PD; Baudenbacher, F; Santiso, J
Citation
Lin, W., Hatton, P., Baudenbacher, F., & Santiso, J. (1998). Observation of small interfacial strains in YBa2Cu3Ox sub-micron-thick films grown on SrTiO3 substrates. Applied Physics Letters, 72(23), 2966-2968. https://doi.org/10.1063/1.121509
| Journal Article Type | Article |
|---|---|
| Publication Date | 1998-06 |
| Journal | Applied Physics Letters |
| Print ISSN | 0003-6951 |
| Electronic ISSN | 1077-3118 |
| Publisher | American Institute of Physics |
| Volume | 72 |
| Issue | 23 |
| Pages | 2966-2968 |
| DOI | https://doi.org/10.1063/1.121509 |
| Keywords | X-RAY-DIFFRACTION; CRITICAL CURRENT-DENSITY |
| Public URL | https://durham-repository.worktribe.com/output/1551340 |
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