WJ Lin
A high-resolution synchrotron X-ray scattering study of the surface and interface structures of YBa2Cu3Ox thin films
Lin, WJ; Hatton, PD; Baudenbacher, F; Santiso, J
Citation
Lin, W., Hatton, P., Baudenbacher, F., & Santiso, J. (1998). A high-resolution synchrotron X-ray scattering study of the surface and interface structures of YBa2Cu3Ox thin films. Physica B: Condensed Matter, 248, 56-61
| Journal Article Type | Article |
|---|---|
| Publication Date | 1998-06 |
| Journal | Physica B: Condensed Matter |
| Print ISSN | 0921-4526 |
| Electronic ISSN | 1873-2135 |
| Publisher | Elsevier |
| Volume | 248 |
| Pages | 56-61 |
| Keywords | X-ray diffraction and scattering; interface structure and roughness; structure and morphology; thickness; high-T-c filmsDIFFRACTION; REFLECTIVITY; ROUGHNESS |
| Public URL | https://durham-repository.worktribe.com/output/1519156 |
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