K. Xiong
Electronic defects in LaAlO3
Xiong, K.; Robertson, J.; Clark, S.J.
Citation
Xiong, K., Robertson, J., & Clark, S. (2008). Electronic defects in LaAlO3. Microelectronic Engineering, 85(1, SI), 65-69. https://doi.org/10.1016/j.mee.2007.01.181
| Journal Article Type | Article |
|---|---|
| Publication Date | 2008-01 |
| Deposit Date | Jan 31, 2012 |
| Journal | Microelectronic Engineering |
| Print ISSN | 0167-9317 |
| Publisher | Elsevier |
| Volume | 85 |
| Issue | 1, SI |
| Pages | 65-69 |
| DOI | https://doi.org/10.1016/j.mee.2007.01.181 |
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