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Electronic defects in LaAlO3

Xiong, K.; Robertson, J.; Clark, S.J.

Authors

K. Xiong

J. Robertson



Citation

Xiong, K., Robertson, J., & Clark, S. (2008). Electronic defects in LaAlO3. Microelectronic Engineering, 85(1, SI), 65-69. https://doi.org/10.1016/j.mee.2007.01.181

Journal Article Type Article
Publication Date 2008-01
Deposit Date Jan 31, 2012
Journal Microelectronic Engineering
Print ISSN 0167-9317
Electronic ISSN 1873-5568
Publisher Elsevier
Volume 85
Issue 1, SI
Pages 65-69
DOI https://doi.org/10.1016/j.mee.2007.01.181
Public URL https://durham-repository.worktribe.com/output/1518861



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