Simon P Poland
A demonstration of the effectiveness of a single aberration correction per optical slice in beam scanned optically sectioning microscopes.
Poland, Simon P; Wright, Amanda J; Cobb, Stuart; Vijverberg, Jacob C; Girkin, John M
Authors
Amanda J Wright
Stuart Cobb
Jacob C Vijverberg
Professor John Girkin j.m.girkin@durham.ac.uk
Professor
Citation
Poland, S. P., Wright, A. J., Cobb, S., Vijverberg, J. C., & Girkin, J. M. (2010). A demonstration of the effectiveness of a single aberration correction per optical slice in beam scanned optically sectioning microscopes. Micron, 38, 200-206. https://doi.org/10.1016/j.micron.2010.05.018
| Journal Article Type | Article |
|---|---|
| Publication Date | 2010 |
| Deposit Date | Nov 8, 2011 |
| Journal | Micron |
| Print ISSN | 0968-4328 |
| Publisher | Elsevier |
| Volume | 38 |
| Pages | 200-206 |
| DOI | https://doi.org/10.1016/j.micron.2010.05.018 |
| Public URL | https://durham-repository.worktribe.com/output/1502797 |
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