S Martín
Identifying Diversity in Nanoscale Electrical Break Junctions
Martín, S; Grace, I; Bryce, MR; Wang, C; Jitchati, R; Batsanov, AS; Higgins, SJ; Lambert, CJ; Nichols, RJ
Authors
I Grace
Professor Martin Bryce m.r.bryce@durham.ac.uk
Professor
C Wang
R Jitchati
AS Batsanov
SJ Higgins
CJ Lambert
RJ Nichols
Citation
Martín, S., Grace, I., Bryce, M., Wang, C., Jitchati, R., Batsanov, A., …Nichols, R. (2010). Identifying Diversity in Nanoscale Electrical Break Junctions. Journal of the American Chemical Society, 132(26), 9157-9164. https://doi.org/10.1021/ja103327f
| Journal Article Type | Article |
|---|---|
| Publication Date | 2010 |
| Deposit Date | Feb 1, 2012 |
| Journal | Journal of the American Chemical Society |
| Print ISSN | 0002-7863 |
| Electronic ISSN | 1520-5126 |
| Publisher | American Chemical Society |
| Volume | 132 |
| Issue | 26 |
| Pages | 9157-9164 |
| DOI | https://doi.org/10.1021/ja103327f |
| Public URL | https://durham-repository.worktribe.com/output/1485146 |