Enhanced electric field sensitivity of rf-dressed Rydberg dark states

Bason, MG; Tanasittikosol, M; Sargsyan, A; Mohapatra, AK; Sarkisyan, D; Potvliege, RM; Adams, CS

Abstract

Optical detection of Rydberg states using electromagnetically induced transparency (EIT) enables continuous measurement of electric fields in a confined geometry. In this paper, we demonstrate the formation of radio frequency (rf)-dressed EIT resonances in a thermal Rb vapour and show that such states exhibit enhanced sensitivity to dc electric fields compared to their bare counterparts. Fitting the corresponding EIT profile enables precise measurements of the dc field independent of laser frequency fluctuations. Our results suggest that space charges within the enclosed cell reduce electric field inhomogeneities within the interaction region.

Citation

Bason, M., Tanasittikosol, M., Sargsyan, A., Mohapatra, A., Sarkisyan, D., Potvliege, R., & Adams, C. (2010). Enhanced electric field sensitivity of rf-dressed Rydberg dark states. New Journal of Physics, 12, Article 065015. https://doi.org/10.1088/1367-2630/12/6/065015

• Journal Article Type: Article
• Online Publication Date: Jun 28, 2010
• Publication Date: Jun 28, 2010
• Deposit Date: Feb 21, 2012
• Publicly Available Date: May 18, 2017
• Journal: New Journal of Physics
• Electronic ISSN: 1367-2630
• Publisher: IOP Publishing
• Peer Reviewed: Peer Reviewed
• Volume: 12
• Article Number: 065015
• DOI: https://doi.org/10.1088/1367-2630/12/6/065015
• Public URL: https://durham-repository.worktribe.com/output/1481706