Dr Buddhika Mendis b.g.mendis@durham.ac.uk
Professor
There is renewed interest in cathodoluminescence (CL) in the transmission electron microscope, since it can be combined with low energy loss spectroscopy measurements and can also be used to probe defects, such as grain boundaries and dislocations, at high spatial resolution. Transition radiation (TR), which is emitted when the incident electron crosses the vacuum-specimen interface, is however an important artefact that has received very little attention. The importance of TR is demonstrated on a wedge shaped CdTe specimen of varying thickness. For small specimen thicknesses (<250 nm) grain boundaries are not visible in the panchromatic CL image. Grain boundary contrast is produced by electron–hole recombination within the foil, and a large fraction of that light is lost to multiple-beam interference, so that thicker specimens are required before the grain boundary signal is above the TR background. This is undesirable for high spatial resolution. Furthermore, the CL spectrum contains additional features due to TR which are not part of the ‘bulk’ specimen. Strategies to minimise the effects of TR are also discussed.
Journal Article Type | Article |
---|---|
Acceptance Date | May 2, 2016 |
Online Publication Date | May 3, 2016 |
Publication Date | Aug 1, 2016 |
Deposit Date | May 10, 2016 |
Publicly Available Date | May 3, 2017 |
Journal | Ultramicroscopy |
Print ISSN | 0304-3991 |
Publisher | Elsevier |
Peer Reviewed | Peer Reviewed |
Volume | 167 |
Pages | 31-42 |
DOI | https://doi.org/10.1016/j.ultramic.2016.05.002 |
Public URL | https://durham-repository.worktribe.com/output/1382373 |
Accepted Journal Article
(560 Kb)
PDF
Publisher Licence URL
http://creativecommons.org/licenses/by-nc-nd/4.0/
Copyright Statement
© 2016 This manuscript version is made available under the CC-BY-NC-ND 4.0 license http://creativecommons.org/licenses/by-nc-nd/4.0/
Se Inter-Diffusion Limits Absorber Layer Grain Growth in CdSe-CdTe Photovoltaics
(2024)
Journal Article
Grain-Boundary Structural Relaxation in Sb2Se3 Thin-Film Photovoltaics
(2024)
Journal Article
Modelling dynamical 3D electron diffraction intensities. I. A scattering cluster algorithm
(2024)
Journal Article
About Durham Research Online (DRO)
Administrator e-mail: dro.admin@durham.ac.uk
This application uses the following open-source libraries:
Apache License Version 2.0 (http://www.apache.org/licenses/)
Apache License Version 2.0 (http://www.apache.org/licenses/)
SIL OFL 1.1 (http://scripts.sil.org/OFL)
MIT License (http://opensource.org/licenses/mit-license.html)
CC BY 3.0 ( http://creativecommons.org/licenses/by/3.0/)
Powered by Worktribe © 2024
Advanced Search