Modifications to the synthetic aperture microwave imaging diagnostic

Brunner, K.J.; Chorley, J.C.; Dipper, N.A.; Naylor, G.; Sharples, R.M.; Taylor, G.; Thomas, D.A.; Vann, R.G.L.

Abstract

The synthetic aperture microwave imaging diagnostic has been operating on the MAST experiment since 2011. It has provided the first 2D images of B-X-O mode conversion windows and showed the feasibility of conducting 2D Doppler back-scattering experiments. The diagnostic heavily relies on field programmable gate arrays to conduct its work. Recent successes and newly gained experience with the diagnostic have led us to modify it. The enhancements will enable pitch angle profile measurements, O and X mode separation, and the continuous acquisition of 2D DBS data. The diagnostic has also been installed on the NSTX-U and is acquiring data since May 2016.

Citation

Brunner, K., Chorley, J., Dipper, N., Naylor, G., Sharples, R., Taylor, G., …Vann, R. (2016). Modifications to the synthetic aperture microwave imaging diagnostic. Review of Scientific Instruments, 87(11), Article 11E129. https://doi.org/10.1063/1.4961283

• Journal Article Type: Article
• Acceptance Date: Aug 2, 2016
• Online Publication Date: Nov 14, 2016
• Publication Date: Sep 2, 2016
• Deposit Date: Oct 5, 2016
• Publicly Available Date: Mar 8, 2017
• Journal: Review of Scientific Instruments
• Print ISSN: 0034-6748
• Publisher: American Institute of Physics
• Peer Reviewed: Peer Reviewed
• Volume: 87
• Issue: 11
• Article Number: 11E129
• DOI: https://doi.org/10.1063/1.4961283
• Public URL: https://durham-repository.worktribe.com/output/1373192