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Silicon Detector Dark Matter Results from the Final Exposure of CDMS II

Agnese, R.; Ahmed, Z.; Anderson, A.J.; Arrenberg, S.; Balakishiyeva, D.; Basu Thakur, R.; Bauer, D.A.; Billard, J.; Borgland, A.; Brandt, D.; Brink, P.L.; Bruch, T.; Bunker, R.; Cabrera, B.; Caldwell, D.O.; Cerdeño, D.G.; Chagani, H.; Cooley, J.; Cornell, B.; Crewdson, C.H.; Cushman, P.; Daal, M.; Dejongh, F.; do Couto e Silva, E.; Doughty, T.; Esteban, L.; Fallows, S.; Figueroa-Feliciano, E.; Filippini, J.; Fox, J.; Fritts, M.; Godfrey, G.L.; Golwala, S.R.; Hall, J.; Harris, R.H.; Hertel, S.A.; Hofer, T.; Holmgren, D.; Hsu, L.; Huber, M.E.; Jastram, A.; Kamaev, O.; Kara, B.; Kelsey, M.H.; Kennedy, A.; Kim, P.; Kiveni, M.; Koch, K.; Kos, M.; Leman, S.W.; Loer, B.; Lopez Asamar, E.; Mahapatra, R.; Mandic, V.; Martinez, C.; McCarthy, K.A.; Mirabolfathi, N.; Moffatt, R.A.; Moore, D.C.; Nadeau, P.; Nelson, R.H.; Page, K.; Partridge, R.; Pepin, M.; Phipps, A.; Prasad, K.; Pyle, M.; Qiu, H.; Rau, W.; Redl, P.; Reisetter, A.; Ricci, Y.; Saab, T.; Sadoulet, B.; Sander, J.; Schneck, K.; Schnee,...

Authors

R. Agnese

Z. Ahmed

A.J. Anderson

S. Arrenberg

D. Balakishiyeva

R. Basu Thakur

D.A. Bauer

J. Billard

A. Borgland

D. Brandt

P.L. Brink

T. Bruch

R. Bunker

B. Cabrera

D.O. Caldwell

D.G. Cerdeño

H. Chagani

J. Cooley

B. Cornell

C.H. Crewdson

P. Cushman

M. Daal

F. Dejongh

E. do Couto e Silva

T. Doughty

L. Esteban

S. Fallows

E. Figueroa-Feliciano

J. Filippini

J. Fox

M. Fritts

G.L. Godfrey

S.R. Golwala

J. Hall

R.H. Harris

S.A. Hertel

T. Hofer

D. Holmgren

L. Hsu

M.E. Huber

A. Jastram

O. Kamaev

B. Kara

M.H. Kelsey

A. Kennedy

P. Kim

M. Kiveni

K. Koch

M. Kos

S.W. Leman

B. Loer

E. Lopez Asamar

R. Mahapatra

V. Mandic

C. Martinez

K.A. McCarthy

N. Mirabolfathi

R.A. Moffatt

D.C. Moore

P. Nadeau

R.H. Nelson

K. Page

R. Partridge

M. Pepin

A. Phipps

K. Prasad

M. Pyle

H. Qiu

W. Rau

P. Redl

A. Reisetter

Y. Ricci

T. Saab

B. Sadoulet

J. Sander

K. Schneck

R.W. Schnee

S. Scorza

B. Serfass

B. Shank

D. Speller

K.M. Sundqvist

A.N. Villano

B. Welliver

D.H. Wright

S. Yellin

J.J. Yen

J. Yoo

B.A. Young

J. Zhang



Abstract

We report results of a search for weakly interacting massive particles (WIMPS) with the silicon detectors of the CDMS II experiment. This blind analysis of 140.2 kg day of data taken between July 2007 and September 2008 revealed three WIMP-candidate events with a surface-event background estimate of 0.41+0.20−0.08(stat)+0.28−0.24(syst). Other known backgrounds from neutrons and Pb206 are limited to <0.13 and <0.08 events at the 90% confidence level, respectively. The exposure of this analysis is equivalent to 23.4 kg day for a recoil energy range of 7–100 keV for a WIMP of mass 10  GeV/c2. The probability that the known backgrounds would produce three or more events in the signal region is 5.4%. A profile likelihood ratio test of the three events that includes the measured recoil energies gives a 0.19% probability for the known-background-only hypothesis when tested against the alternative WIMP+background hypothesis. The highest likelihood occurs for a WIMP mass of 8.6  GeV/c2 and WIMP-nucleon cross section of 1.9×10−41  cm2.

Citation

Agnese, R., Ahmed, Z., Anderson, A., Arrenberg, S., Balakishiyeva, D., Basu Thakur, R., …Zhang, J. (2013). Silicon Detector Dark Matter Results from the Final Exposure of CDMS II. Physical Review Letters, 111(25), Article 251301. https://doi.org/10.1103/physrevlett.111.251301

Journal Article Type Article
Acceptance Date Dec 16, 2013
Online Publication Date Dec 16, 2013
Publication Date Dec 16, 2013
Deposit Date Nov 27, 2016
Journal Physical Review Letters
Print ISSN 0031-9007
Electronic ISSN 1079-7114
Publisher American Physical Society
Peer Reviewed Peer Reviewed
Volume 111
Issue 25
Article Number 251301
DOI https://doi.org/10.1103/physrevlett.111.251301
Public URL https://durham-repository.worktribe.com/output/1370758
Related Public URLs https://arxiv.org/abs/1304.4279