Identification of Slow States at the SiO₂/SiC Interface through Sub-Bandgap Illumination

Spargo, C.M.; Furnival, B.J.D.; Mahapatra, R.M.; Goss, J.P.; Wright, N.G.; Horsfall, A.B.

doi:10.4028/www.scientific.net/msf.717-720.801

Identification of Slow States at the SiO₂/SiC Interface through Sub-Bandgap Illumination

Spargo, C.M.; Furnival, B.J.D.; Mahapatra, R.M.; Goss, J.P.; Wright, N.G.; Horsfall, A.B.

Authors

C.M. Spargo

B.J.D. Furnival

R.M. Mahapatra

J.P. Goss

N.G. Wright

A.B. Horsfall

Contributors

Dr Christopher Donaghy Spargo christopher.spargo@durham.ac.uk
Other

Citation

Spargo, C., Furnival, B., Mahapatra, R., Goss, J., Wright, N., & Horsfall, A. (2012). Identification of Slow States at the SiO₂/SiC Interface through Sub-Bandgap Illumination. Materials Science Forum, 717-720, https://doi.org/10.4028/www.scientific.net/msf.717-720.801

Journal Article Type	Article
Publication Date	2012
Deposit Date	Apr 21, 2017
Journal	Materials Science Forum
Print ISSN	0255-5476
Publisher	Trans Tech Publications
Peer Reviewed	Peer Reviewed
Volume	717-720
DOI	https://doi.org/10.4028/www.scientific.net/msf.717-720.801