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Barrier Height Measurement of Metal Contacts to Si Nanowires Using Internal Photoemission of Hot Carriers

Yoon, KunHo; Hyun, Jerome K; Connell, Justin G; Amit, Iddo; Rosenwaks, Yossi; Lauhon, Lincoln J

Authors

KunHo Yoon

Jerome K Hyun

Justin G Connell

Dr Iddo Amit iddo.amit@durham.ac.uk
Assistant Professor

Yossi Rosenwaks

Lincoln J Lauhon

Journal Article Type	Article
Publication Date	2013
Deposit Date	Jul 5, 2018
Journal	Nano Letters
Print ISSN	1530-6984
Publisher	American Chemical Society
Volume	13
Issue	12
Pages	6183-6188
Public URL	https://durham-repository.worktribe.com/output/1355085

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