KunHo Yoon
Barrier Height Measurement of Metal Contacts to Si Nanowires Using Internal Photoemission of Hot Carriers
Yoon, KunHo; Hyun, Jerome K; Connell, Justin G; Amit, Iddo; Rosenwaks, Yossi; Lauhon, Lincoln J
Authors
Jerome K Hyun
Justin G Connell
Dr Iddo Amit iddo.amit@durham.ac.uk
Assistant Professor
Yossi Rosenwaks
Lincoln J Lauhon
Citation
Yoon, K., Hyun, J. K., Connell, J. G., Amit, I., Rosenwaks, Y., & Lauhon, L. J. (2013). Barrier Height Measurement of Metal Contacts to Si Nanowires Using Internal Photoemission of Hot Carriers. Nano Letters, 13(12), 6183-6188
| Journal Article Type | Article |
|---|---|
| Publication Date | 2013 |
| Deposit Date | Jul 5, 2018 |
| Journal | Nano Letters |
| Print ISSN | 1530-6984 |
| Electronic ISSN | 1530-6992 |
| Publisher | American Chemical Society |
| Volume | 13 |
| Issue | 12 |
| Pages | 6183-6188 |
| Public URL | https://durham-repository.worktribe.com/output/1355085 |
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